Wafer Analysis & Test Foundry Services > Wafer Analysis & Test We have an extensive suite of wafer analysis and materials characterisation capabilities. These are necessary for the successful control of the wafer growth and the processing capabilities we offer to our customers. Capabilities Photo Luminescence Wafer Mapping High Resolution X-Ray Diffraction SIMS Auger Analysis Scanning Electron Microscopy including CL, EBIC and D-EBIC Electrochemical C-V; Hall measurement Ellipsometry X-Ray Fluorescence Reflectometry Thickness (profilometry / optical) Film stress measurement Resistivity (4-point probe) Cedova also has access to additional facilities located on the premises of Philips Research Laboratories as well as a range of laboratories within the vicinity of Eindhoven.